The dual-beam scanning electron microscope offers two very high resolution imaging modes:
- serial acquisition of images by 2D translation,
- the acquisition of images plane by plane using nanometric extrusion of the sample for a 3D representation at very high resolution.
Our electron microscope allows the acquisition of high contrast images with a resolution of up to 2 nm. It produces images for the description of the ultrastructure of a sample, the characterization of nanoparticles and the statistical counting of elements of interest.